The Energy Dispersive X-ray Fluorescence Spectrometer EDX-7000/8000 measures the energy (keV) and intensity of the generated fluorescent X-rays to determine the type and content of the elements comprising a sample. It is applied for non-destructive elemental analysis of solid, powder, and liquid samples. It is widely used by electronics and automobile manufacturers around the world.
Principle of Fluorescent X-ray Generation
When a sample is irradiated with X-rays from an X-ray tube, the atoms in the sample generate unique X-rays that are emitted from the sample. Such X-rays are known as "fluorescent X-rays" and they have a unique wavelength and energy that is characteristic of each element that generates them. Consequently, qualitative analysis can be performed by investigating the wavelengths of the X-rays. As the fluorescent X-ray intensity is a function of the concentration, quantitative analysis is also possible by measuring the amount of X-rays at the wavelength specific to each element.