Materials research microscopes

Resolution: 120, 405, 640, 561, 488 nm

... confocal laser scanning microscope (CLSM) from ZEISS, is the one instrument you will need for materials analysis. Characterize 3D microstructures surfaces topography in your lab or multi-user facility. ...

Magnification: 1 unit - 2,000,000 unit

ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron optics and ...

... precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis. Versatile solution for central microscopy facilities ...

DOM-1001 is a 16 Million Pixels high-end integrated digital microscope, and enables real-time record, collect, and share high-definition 4K images and videos(1080P). Multiple people can view samples simultaneously, ...

Magnification: 10 unit - 1,000 unit
Weight: 9.1 kg
Height: 420 mm

Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. Interpupillary distance: Adjustable between 50 and 75 mm. Dioptric adjustment: On the left eyepiece tube. Eyepieces: WF10x/22 mm, high eye-point and with rubber cups. Nosepiece: ...

Magnification: 10 unit - 1,000 unit
Weight: 9.1 kg
Width: 270 mm

Eyepiece PL 10x/22, High Eyepoint Nosepiece Quintuple revolving nosepiece Objectives IOS W-PLAN 4x, 10x, 40x, 100x Stage Double layer, 233×147 mm, moving range 78×54 mm, Belt-drive in X direction Focusing Coaxial coarse and fine, ...

Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. Interpupillary distance: Adjustable between 50 and 75 mm. Dioptric adjustment: On the left eyepiece tube. Eyepieces: WF10x/22 mm, high eye-point and with rubber cups. Nosepiece: ...

Magnification: 1,000,000 unit

... that are common in industry, materials science and semiconductors — like metallurgical cross-sections, welded structures, or printed circuit boards – TESCAN VEGA Compact is a great choice for not only your current materials ...

UHR SEM for nanomaterials characterization at sub-nanometer scale High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent ...

... 4D-STEM The full picture of electron beam - specimen interaction 4D-STEM is the microscopy method of choice for true nanoscale, multimodal characterization of material properties such as morphology, ...

... performance standard for micro-Raman research capabilities. Configuration Stability and Flexibility The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman ...

Weight: 11 kg

Ceti’s Ferox Trinocular Inverted Materials Microscope is an inverted, trinocular reflected microscope which is ideal for geological and engineering applications. The quadruple nosepiece ...

The inVia™ Qontor® confocal Raman microscope is a flexible research-grade instrument with unique real-time focus tracking capabilities.

Magnification: 20, 200, 500 unit
Weight: 1.4 kg
Length: 20 cm

... or projector in real time. Levenhuk DTX 500 LCD Digital Microscope is powered by the Li-ion battery included in the kit, which provides for up to 2 hours of standalone work. The microscope may also ...