{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Resolution: 0.1, 0.11, 0.25, 0.07, 0.16 nm
... technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages. The microscope room is separated from the operation room to respond to a remote operation. In addition, JEOL products’ ...
Jeol
Magnification: 10 unit - 1,500,000 unit
Resolution: 0.2, 0.14 nm
... increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function. High-sensitivity ...
Jeol
Magnification: 50 unit - 1,200,000 unit
Resolution: 0.2, 0.14 nm
Width: 840 mm
... Transmission Electron Microscopes(TEM) with 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We newly developed JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With ...
Jeol
... Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM. No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow. New functions are available to ensure high quality ...
Jeol
Resolution: 0.5 nm - 3 nm
The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" ...
Jeol
... Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications are expanding ...
Jeol
Magnification: 150, 10,000, 100, 500, 5,000 unit
Resolution: 3, 15 nm
... Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites. At those scenes, the same observation processes need to be performed repeatedly and there has ...
Jeol
Magnification: 20 unit - 1,000,000 unit
Resolution: 4 nm
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed the JIB-4700F Multi Beam System to be used ...
Jeol