HITACHI laboratory microscopes

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm

Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample ...

Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm

FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...

Magnification: 10 unit - 250,000 unit
Length: 617 mm

Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, depth of field, ...

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... sample. Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners ...

Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm

The HT7800 family supports a wide range of applications, from life sciences to materials science. It’s available in three different pole piece variants, always based on our patented objective lens for fast switching between high contrast ...

Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm

The Hitachi SU3800SE and SU3900SE SEMs provide versatile imaging and analytical solutions for various applications. These instruments offer high-resolution imaging, intuitive navigation, and advanced automation, delivering reliable, consistent ...

Magnification: 0 unit
Resolution: 4, 60 nm

... “ETHOS” FIB-SEM platform targets advanced position-accurate applications in the areas of automated production of ultra-fine TEM lamellae for aberration-corrected TEM/STEM, high-resolution multi signal SEM examination ...

Resolution: 1.6, 2.1, 4 nm

In this unique system, the Ga-FIB and FE-SEM columns are at right angles to each other. This configuration is ideal for applications where large volumes (biological tissue, materials with large grain structures, semiconductor components, ...

Resolution: 2.8, 60, 4, 3.5 nm

NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface ...