HITACHI laboratory microscopes

Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...

... With EM Wizard, beginners become experts overnight. Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand. A robust "draw-out" specimen chamber accommodates ...

Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Width: 330 mm

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

Resolution: 4, 60, 0.7, 50, 1.5 nm

... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, ...

Resolution: 2.1, 1.6 nm

... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...

Resolution: 60, 4, 2.8, 3.5 nm

... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...