HITACHI laboratory microscopes

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9 nm

... Schottky FE-SEMs for both ultra high-resolution imaging and analytical work Ideal for users who want both ultra high-resolution imaging and analytical capabilities. Analytical working distance of just 6 mm. Display up to six image channels in ...

Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm

... The super-compact VP-SEM with a choice of floor-standing or tabletop setup. Compact and flexible design High-resolution imaging Adaptable vacuum modes 5-axis sample stage Automated, user-friendly operation The FlexSEM II VP-SEM is designed ...

Magnification: 10 unit - 250,000 unit
Length: 617 mm

... manager striving for consistent results, the TM4000PlusIII is built to meet your needs. This microscope brings the power of scanning electron microscopy into an accessible, tabletop design. It combines ease of use ...

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... opposed dual 100 mm2 EDX* detectors : "Symmetrical Dual SDD*" Newly designed enclosure for optimum performance in real laboratory environments A wide range of Hitachi advanced specimen holders* High-brightness Cold FEG×High-stability×Hitachi ...

Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm

... The HT7800 series is a 120 kV transmission electron microscope (TEM) that combines high-quality and reproducible data acquisition with improved efficiency for observation work. By automating routine alignments and settings, and featuring ...

Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm

... user-friendly automation imaging needs in academia and industry. The Hitachi SU3800SE and SU3900SE scanning electron microscopes give you an imaging and analytical solution for a wide range of applications. These instruments deliver ...

Resolution: 60, 4 nm

... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, Delivering ...

Resolution: 1.6, 2.1, 4 nm

... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing for a wide ...

Resolution: 2.8, 60, 4, 3.5 nm

... NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface processing ...