HITACHI microscopes

Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...

... With EM Wizard, beginners become experts overnight. Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand. A robust "draw-out" specimen chamber accommodates ...

Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Width: 330 mm

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

Resolution: 4, 60, 0.7, 50, 1.5 nm

... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, ...

Resolution: 2.1, 1.6 nm

... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...

Resolution: 60, 4, 2.8, 3.5 nm

... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...

Resolution: 0.3 nm

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, ...