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TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. ...
TESCAN GmbH
Field-free analytical UHR SEM for materials characterization at the nanoscale Uncompromised characterization of all types of materials at the nanoscale Ideal for characterization of materials at low beam energies for maximum surface ...
TESCAN GmbH
Volume SEM methods provide insights into biological material in high resolution that allows researchers to comprehensively understand the internal structure and functioning of biological systems in 3D. ...
TESCAN GmbH
... capabilities for the structural analysis of biological samples. It seamlessly combines the high-precision milling capabilities of a Ga FIB with a BrightBeam™ UHR SEM for sub-surface exploration of a diverse range of biological ...
TESCAN GmbH
The TESCAN AMBER X is a high-performance focused plasma ion beam-scanning electron microscope (FIB-SEM) for extra-large volume analysis and high throughput cryo applications. Equipped with the iFIB+ column, TESCAN AMBER ...
TESCAN GmbH
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