Raman microscope Dimension Icon-Raman
AFMfor materials researchbenchtop

Raman microscope
Raman microscope
Raman microscope
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Characteristics

Type
Raman, AFM
Applications
for materials research
Configuration
benchtop
Other characteristics
high-resolution

Description

Incorporating the industry-leading AFM and a research-grade confocal Raman microscope on a single platform. With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease. The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

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