Product overviewThe ChromaLine sensor family from STIL is a non-contact chromatic confocal solution for high-speed line measurements and on-line inspection. The MPLS-DM version provides 180 aligned measuring points across line lengths from 1.34 to 12.85 mm, designed for continuous industrial use with low maintenance requirements.
DescriptionMPLS-DM delivers high-resolution distance and thickness measurements with measuring frequencies from 200 Hz up to 2 kHz in standard mode and up to 6 kHz with a reduced measuring range. The sensor supports peak-based distance extraction (first/last and intermediate peaks) and thickness calculation from multiple peaks. Integrated optical head uses passive components for industrial reliability.
Benefits- Versatile non-contact measurement for reflective materials (metals, glass, plastics, coatings, liquids)
- Industrial-grade optical head built with passive components for long service life
- High throughput: up to 360,000 measured points/second at 2 kHz; >1,000,000 points/second at 6 kHz in dedicated applications
- Distance and multi-peak thickness measurement modes
- High axial resolution and low noise for fine surface and thickness control
- SDK and protocol commands for straightforward integration
- Synchronized acquisitions with encoder input for dynamic processes
- Gigabit Ethernet communication for fast data transfer
Applications- Automotive glass inspection
- Container and packaging glass production
- Electric vehicle industry (battery cell and cover measurements)
- Roll-to-roll and film thickness control (transparent and opaque films, flexible electronics)
- Electronics (PCB) inspection
- Semiconductor wafers (silicon)
- Consumer electronics components
- Medical component inspection
- Micromechanics and precision engineering
- Aerospace surface and assembly inspection
- Watchmaking and microassembly
- Robotics integration for automated inspection
VersionsChromaLine sensors are available in five standard MPLS-DM variants: NANOVIEW, MicroView, WireView, DeepView mk2 and SuperView, each optimized for line length and measurement range.
Technical data (controller / general)Controller: MPLS-DM
Technology: Chromatic Confocal
Light source: White LED
Number of points: 180
Measuring frequency: 200 Hz – 2000 Hz (up to 6000 Hz with reduced measuring range)
Distance measurement: Highest / First / Second / Third / Fourth / Last peak
Thickness measurement: 2 of 5 peaks
Digital output: Gigabit Ethernet
Synchronization: Trigger in/out
Other I/O: Encoder input (1)
Fiber bundle length: 5 m
Operating temperature: 5 °C – 50 °C
Storage temperature: -30 °C – 70 °C
Relative humidity: 5% – 80% RH non-condensing
Protection: IP20
Compliance: EN 61010-1; EN 61326-1
Power supply: 100–240 Vac
Power consumption (max/typ): 120 W / 70 W
Dimensions (mm): 448.9 x 184 x 497
Weight: 14.5 kg
Technical data (sensor versions - comparative values)Models / MPLS-DM (NANOVIEW / WIREVIEW / MICROVIEW / DEEPVIEW mk2 / SUPERVIEW) — Order codes: OPSTM705002 (NANOVIEW), OPSTM710002 (WIREVIEW), OPSTM706002 (MICROVIEW), OPST0707002 (DEEPVIEW mk2), OPSTM711001 (SUPERVIEW).
Line length (mm): 1.34 / 1.51 / 1.8 / 4.2 / 12.85
Measuring range @2 kHz (mm): 0.12 / 0.9 / 0.5 / 2.6 / 2
Working distance (mm): 7.4 / 7.8 / 10.1 / 19.5 / 11.3
Numerical aperture: 0.75 / 0.75 / 0.5 / 0.37 / 0.33
Max sample slope (°): ±43 / ±46 / ±30 / ±20 / ±17
Pitch (µm): 7.5 / 8.5 / 10.1 / 23.5 / 71.8
Max linearity error (µm): ±0.04 / ±0.1 / ±0.08 / ±0.12 / ±0.12
Static noise (nm): 25 / 150 / 100 / 300 / 300
Axial resolution (µm): 0.15 / 0.9 / 0.6 / 1.8 / 1.8
Spot size (µm): 2.9 / 3.2 / 3.8 / 8.8 / 27.2
Homogeneity (nm): 30 / 200 / 125 / 400 / 400
Min measurable thickness (µm): 18 / 110 / 50 / 250 / 300
Length / diameter / weight (mm / mm / g): NANOVIEW 436.1 / 50 / 2350 ; WIREVIEW 482.5 / 70 / 2850 ; MICROVIEW 427.3 / 50 / 2250 ; DEEPVIEW mk2 428.3 / 60 / 2800 ; SUPERVIEW 397.8 / 60 / 2550
Measuring range @4 kHz (mm): 0.055* / 0.45* / 0.235* / 1.15* / 0.9*
Measuring range @6 kHz (mm): 0.030* / 0.24* / 0.12* / 0.65* / 0.5*
* Preliminary value