Thickness measuring device MPLS-DM series
for medical applicationscontinuousin-line

Thickness measuring device - MPLS-DM series - MARPOSS - for medical applications / continuous / in-line
Thickness measuring device - MPLS-DM series - MARPOSS - for medical applications / continuous / in-line
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Characteristics

Tested parameter
thickness
Applications
for medical applications
Operating mode
continuous
Configuration
in-line
Other characteristics
digital
Weight

14.5 kg
(32 lb)

Width

18.4 cm
(7.2 in)

Height

Min.: 49.7 cm
(19.6 in)

49.7 cm
(19.6 in)

Max.: 49.7 cm
(19.6 in)

Description

Product overview
The ChromaLine sensor family from STIL is a non-contact chromatic confocal solution for high-speed line measurements and on-line inspection. The MPLS-DM version provides 180 aligned measuring points across line lengths from 1.34 to 12.85 mm, designed for continuous industrial use with low maintenance requirements.

Description
MPLS-DM delivers high-resolution distance and thickness measurements with measuring frequencies from 200 Hz up to 2 kHz in standard mode and up to 6 kHz with a reduced measuring range. The sensor supports peak-based distance extraction (first/last and intermediate peaks) and thickness calculation from multiple peaks. Integrated optical head uses passive components for industrial reliability.

Benefits
  • Versatile non-contact measurement for reflective materials (metals, glass, plastics, coatings, liquids)
  • Industrial-grade optical head built with passive components for long service life
  • High throughput: up to 360,000 measured points/second at 2 kHz; >1,000,000 points/second at 6 kHz in dedicated applications
  • Distance and multi-peak thickness measurement modes
  • High axial resolution and low noise for fine surface and thickness control
  • SDK and protocol commands for straightforward integration
  • Synchronized acquisitions with encoder input for dynamic processes
  • Gigabit Ethernet communication for fast data transfer

Applications
  • Automotive glass inspection
  • Container and packaging glass production
  • Electric vehicle industry (battery cell and cover measurements)
  • Roll-to-roll and film thickness control (transparent and opaque films, flexible electronics)
  • Electronics (PCB) inspection
  • Semiconductor wafers (silicon)
  • Consumer electronics components
  • Medical component inspection
  • Micromechanics and precision engineering
  • Aerospace surface and assembly inspection
  • Watchmaking and microassembly
  • Robotics integration for automated inspection

Versions
ChromaLine sensors are available in five standard MPLS-DM variants: NANOVIEW, MicroView, WireView, DeepView mk2 and SuperView, each optimized for line length and measurement range.

Technical data (controller / general)
Controller: MPLS-DM
Technology: Chromatic Confocal
Light source: White LED
Number of points: 180
Measuring frequency: 200 Hz – 2000 Hz (up to 6000 Hz with reduced measuring range)
Distance measurement: Highest / First / Second / Third / Fourth / Last peak
Thickness measurement: 2 of 5 peaks
Digital output: Gigabit Ethernet
Synchronization: Trigger in/out
Other I/O: Encoder input (1)
Fiber bundle length: 5 m
Operating temperature: 5 °C – 50 °C
Storage temperature: -30 °C – 70 °C
Relative humidity: 5% – 80% RH non-condensing
Protection: IP20
Compliance: EN 61010-1; EN 61326-1
Power supply: 100–240 Vac
Power consumption (max/typ): 120 W / 70 W
Dimensions (mm): 448.9 x 184 x 497
Weight: 14.5 kg

Technical data (sensor versions - comparative values)
Models / MPLS-DM (NANOVIEW / WIREVIEW / MICROVIEW / DEEPVIEW mk2 / SUPERVIEW) — Order codes: OPSTM705002 (NANOVIEW), OPSTM710002 (WIREVIEW), OPSTM706002 (MICROVIEW), OPST0707002 (DEEPVIEW mk2), OPSTM711001 (SUPERVIEW).
Line length (mm): 1.34 / 1.51 / 1.8 / 4.2 / 12.85
Measuring range @2 kHz (mm): 0.12 / 0.9 / 0.5 / 2.6 / 2
Working distance (mm): 7.4 / 7.8 / 10.1 / 19.5 / 11.3
Numerical aperture: 0.75 / 0.75 / 0.5 / 0.37 / 0.33
Max sample slope (°): ±43 / ±46 / ±30 / ±20 / ±17
Pitch (µm): 7.5 / 8.5 / 10.1 / 23.5 / 71.8
Max linearity error (µm): ±0.04 / ±0.1 / ±0.08 / ±0.12 / ±0.12
Static noise (nm): 25 / 150 / 100 / 300 / 300
Axial resolution (µm): 0.15 / 0.9 / 0.6 / 1.8 / 1.8
Spot size (µm): 2.9 / 3.2 / 3.8 / 8.8 / 27.2
Homogeneity (nm): 30 / 200 / 125 / 400 / 400
Min measurable thickness (µm): 18 / 110 / 50 / 250 / 300
Length / diameter / weight (mm / mm / g): NANOVIEW 436.1 / 50 / 2350 ; WIREVIEW 482.5 / 70 / 2850 ; MICROVIEW 427.3 / 50 / 2250 ; DEEPVIEW mk2 428.3 / 60 / 2800 ; SUPERVIEW 397.8 / 60 / 2550
Measuring range @4 kHz (mm): 0.055* / 0.45* / 0.235* / 1.15* / 0.9*
Measuring range @6 kHz (mm): 0.030* / 0.24* / 0.12* / 0.65* / 0.5*
* Preliminary value

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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