laboratory microscope / digital / SIM / ultra-high resolution
N-SIM E

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Characteristics

  • Applications:

    laboratory

  • Type:

    digital

  • Observation technique:

    SIM

  • Other characteristics:

    ultra-high resolution

Description

Introducing an all-new super-resolution system for the individual lab. Achieve 2x resolution at half the price!

Utilizing structured illumination microscopy (SIM) technology, the all-new N-SIM E realizes double the spatial resolution of conventional optical microscopes (to approximately 115 nm). N-SIM E is a streamlined, affordable super-resolution system supporting only essential, commonly used excitation wavelengths and imaging modes, making it an obvious choice for individual labs.