{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
{{product.productLabel}} {{product.model}}
{{#if product.featureValues}}{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{#each product.specData:i}}
{{name}}: {{value}}
{{#i!=(product.specData.length-1)}}
{{/end}}
{{/each}}
{{{product.idpText}}}
Magnification: 2,000 unit - 1,500,000 unit
Resolution: 0.1 nm - 0.31 nm
... Integration to other instruments The microscope can be fully controlled with PC. The design concept enables us to integrate EDS system and CCD cameras. Application Exploring Biological Samples in 3D Beyond ...
Jeol
... the equipment remains in optimal condition. Live- 3 D Function Choose our multi-segmented, semiconductor type BSE detector to create a Live 3D reconstruction of the sample surface. View the 3D ...
Jeol
Resolution: 0.5 nm - 3 nm
... responsiveness and produces sharp material contrast even at a low accelerating voltage, while the VBED can help obtain images of 3 D, topography and material contrasts. Thus, the JSM-IT800 can help users to obtain information ...
Jeol
... constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation. When you place the JCM-7000 next to an optical microscope, further-faster ...
Jeol
Magnification: 150, 10,000, 100, 500, 5,000 unit
Resolution: 3, 15 nm
... And LV (Low Vacuum) or L A (Low Vacuum & Analysis) is also required. Live 3D * The images obtained by a new quadrant BE detector* can be displayed as a live 3D image. 3D images can clearly represent ...
Jeol
Magnification: 20 unit - 1,000,000 unit
Resolution: 4 nm
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed the JIB-4700F Multi Beam System to be used ...
Jeol