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Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9 nm
... Schottky FE- SEMs for both ultra high-resolution imaging and analytical work Ideal for users who want both ultra high-resolution imaging and analytical capabilities. Analytical working distance of just 6 mm. Display ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.8, 0.9 nm
... The modern FE- SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm
... Powerful, versatile SEMs designed for performance, large-sample handling, and user-friendly automation imaging needs in academia and industry. The Hitachi SU3800SE and SU3900SE scanning electron microscopes ...
Hitachi High-Tech Europe GmbH
Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
... can be mounted close to the sample for high-resolution elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering angle-dependent ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.8, 0.6, 0.9 nm
... The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE- SEM ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
... The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE- SEM platform incorporates multifaceted ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.8, 0.9 nm
... The modern FE- SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, ...
Hitachi High-Technologies
... JSM-IT810 series FE- SEM. No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow. New functions are available to ensure high quality data and an enhanced user experience ...
Magnification: 1 unit - 2,500,000 unit
... CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope ( FE- SEM, FEG SEM). Advanced column ...
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