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... different programs per lane with synchronous or asynchronous
inspection. SQ3000‑DD offers a compact dual‑sensor layout with a smart
conveyor design, reducing footprint compared with two standalone
systems.
Software ...
Nordson EFD
... Overview
The AMI AW Series C-SAM® automated wafer
inspection
system provides non-immersion ultrasonic scanning using waterfall transducers and a 500 MHz pulser/receiver. It delivers sensitivity better than 5 ...
Nordson EFD
... Overview
FACTS² (AMI DF2400) is an automated in-line C-SAM
inspection
system engineered for high-volume production. It delivers high throughput with minimal operator interaction by inspecting two trays or modules ...
Nordson EFD
... Overview
The QX Series 2D AOI
inspection
systems (QX600™ and QX250i™) provide calibration‑free, high‑throughput optical
inspection for SMT production lines. The platform integrates top and bottom ...
Nordson EFD
... electronics inspection requirements
Nordson EFD
... improved measurement accuracy
Nordson EFD