The SIM (Strobed Inspection Module) is the core of all CyberOptics’ 2D AOI systems. Uniquely designed and manufactured by CyberOptics, the SIM performs high-performance inspections at 110 cm²/sec without requiring calibration. The QX250i, equipped with AI² (Autonomous Image Interpretation) technology, allows ultra-fast programming, taking you from zero to production in less than 13 minutes*. With an 80-megapixel sensor, the QX250i™ significantly enhances solder joint and 01005 inspection performance.
The QX Series 2D AOI inspection systems offer fast, flexible, high-performance inspections for all applications, optimized for pre-reflow and selective inspection. High-resolution Strobed Inspection Modules (SIM) with enhanced lighting provide a unique platform for inspection and defect review, reducing production line time and increasing productivity by up to 50%.
- SIM (Strobed Inspection Module) designed by CyberOptics
- High-performance inspection at 110 cm²/sec
- Calibration-free system
- AI² technology for ultra-fast programming
- From zero to production in less than 13 minutes*
- 80-megapixel sensor (QX250i™)
- Significant improvement in solder joint and 01005 inspection
- Optimized for pre-reflow and selective inspection
- Enhanced lighting for top and bottom inspection
- Productivity increase up to 50%