Scanning electron microscope SU3800/3900 Family

for researchinspectionmultipurpose

Powerful, versatile VP-SEMs with a choice of electron source and specimen chamber size. Designed for performance, large-sample handling, and user-friendly automation imaging needs in academia and industry. Accommodate and inspect large, heavy samples with ease Flexible, robust sample stages for any application Wide-area observation with SEM MAP technology Automation for consistent, high-quality results Designed for a variety of applications The Hitachi SU3800/3900 family is a modular, user-friendly scanning electron microscope platform with variable chamber pressure capabilities. Why choose the SU3800/3900 platform? The Hitachi SU3800/3900 and SU3800SE/3900SE scanning electron microscopes are designed to tackle the challenges of modern microscopy - whether you’re working in academic research, industrial labs, or quality control environments. These instruments offer the perfect balance between versatility, high performance and ease of use, letting you focus on what matters: getting reliable, accurate results every time. Both base models are equipped to handle a wide range of sample sizes and types, from small specimens to large, heavy industrial components. With advanced automation features and powerful navigation tools, the instruments in the SU3800/3900 series help you streamline your workflows, improve productivity, and achieve consistent, high-quality results. Features and benefits Whether you’re working with large industrial materials or smaller research samples, the SU3800 and SU3900 specimen chambers with their eucentric stages have you covered. SU3800: Accommodates samples up to 200 mm in diameter, 80 mm in height, and 2 kg in mass.