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TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ ...
TESCAN GmbH
Field-free analytical UHR SEM for materials characterization at the nanoscale Uncompromised characterization of all types of materials at the nanoscale Ideal for characterization of materials at low beam energies for maximum surface ...
TESCAN GmbH
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