Optical microscope NanoWizard® 4 XP NanoScience

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The NanoWizard® 4 XP NanoScience atomic force microscope delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques. A wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today. Accuracy Investigating Material Properties Mechanical, thermal, and electrical measurements: Visualize crystallization, melting, growth and phase separation. Modify samples with optical stimulation, magnetic fields, or voltage. Streamlined Ideal multi-user platform Advanced options and features for expert users. Extensive range of accessories for investigating conductive films, magnetic force gradients and electrostatic forces. Performance 150 lines/sec, 100µm scan range Streamlined setup for increased productivity. Ideal for dynamic experiments of highly structures samples. Fast and easy movement around the sample. Highest flexibility combined with extreme performance The NanoWizard 4 XP NanoScience is equipped with a range of new features, including: PeakForce Tapping® for easy imaging Fast Scanning option with up to 150 lines/sec NestedScanner Technology for high-speed imaging of surface structures up to 16.5µm with outstanding resolution and stability New tiling functionality for automated mapping of large sample areas V7 Software with revolutionary new workflow-based user interface DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms