Atomic force microscope Innova®
for researchbenchtop

atomic force microscope
atomic force microscope
atomic force microscope
atomic force microscope
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Characteristics

Type
atomic force
Applications
for research
Configuration
benchtop

Description

This Innova microscope delivers superior quality, high resolution imagery (highest resolution AFM in its class) and delivers crystal clear images, and is suitable for research in various fields, including physics and chemistry, as well as others. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility, even for the most demanding scientific research. Features a state of the art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operations. Can scan up to 90 microns without the need to change scanner hardware. The integrated, high-resolution colour optics and (programmable) motorized Z-stage makes finding features and changing tips or samples fast and easy. The Best-Value Research AFM Providing complete AFM capabilities to fit your budget The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.