Raman microscope Innova-IRIS
AFMfor materials researchbenchtop

Raman microscope
Raman microscope
Add to favorites
Compare this product
 

Characteristics

Type
Raman, AFM
Applications
for materials research
Configuration
benchtop

Description

The Most Complete TERS Solution Enabling highest performance AFM-Raman research Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy. Delivering high-performance TERS with complete SPM capabilities Offering performance exclusively enabled by Bruker's commercially available TERS probes Providing productive measurement with guaranteed TERS performance Innova - The Best Place to Start Your AFM Research This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

VIDEO

Catalogs

Innova
Innova
8 Pages
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.