Raman microscope Innova-IRIS
AFMfor materials researchbenchtop

Raman microscope
Raman microscope
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Raman, AFM
for materials research


The Most Complete TERS Solution Enabling highest performance AFM-Raman research Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy. Delivering high-performance TERS with complete SPM capabilities Offering performance exclusively enabled by Bruker's commercially available TERS probes Providing productive measurement with guaranteed TERS performance Innova - The Best Place to Start Your AFM Research This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.



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