The Dimension Icon, manufactured by Bruker, is an atomic force microscope that has been created to look at objects on the atomic level. It provides picture of atoms on or in surfaces. It is also integrated with feedback alignment tools, high-resolution camera, XY positioning, imaging and nanoScope® software, custom user-programmable scripts and exclusive sensor design. Moreover, it enables quick, accessible, reliable and efficient results for the nano scale researchers.
This device is used in a wide range of applications such as material mapping, nanomanipulation, electrical characterization, heating and cooling process. The system has been designed to provide minimal noise consumption and maximum productivity.