AFM microscope Dimension Icon®
for researchfloor-standinghigh-resolution

AFM microscope
AFM microscope
AFM microscope
AFM microscope
AFM microscope
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Characteristics

Type
AFM
Applications
for research
Configuration
floor-standing
Other characteristics
high-resolution

Description

The Dimension Icon, manufactured by Bruker, is an atomic force microscope that has been created to look at objects on the atomic level. It provides picture of atoms on or in surfaces. It is also integrated with feedback alignment tools, high-resolution camera, XY positioning, imaging and nanoScope® software, custom user-programmable scripts and exclusive sensor design. Moreover, it enables quick, accessible, reliable and efficient results for the nano scale researchers. This device is used in a wide range of applications such as material mapping, nanomanipulation, electrical characterization, heating and cooling process. The system has been designed to provide minimal noise consumption and maximum productivity.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.