Nanocharacterization microscope Dimension XR
scanning probebenchtophigh-resolution

nanocharacterization microscope
nanocharacterization microscope
nanocharacterization microscope
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Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping, Data Cube modes, SECM and nanoDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier. Routine Highest Resolution in Air and Liquid From point defects in liquid, in a stiffness map, to atomic resolution in air, in a conductivity map, Dimension XR delivers highest resolution in all measurements. At its core Dimension XR uses Bruker’s proprietary PeakForce Tapping technology to achieve both, hard and soft matter performance benchmarks, including crystal defect resolution, molecular defects in polymers, and the minor groove of the DNA double helix structure. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. Dimension XR combines PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in developing tip scanning systems. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.


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