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... Overview
The AMI AW Series C-SAM®
automated wafer
inspection
system provides non-immersion ultrasonic scanning using waterfall transducers and a 500 MHz pulser/receiver. It delivers sensitivity ...
Nordson EFD
... different programs per lane with synchronous or asynchronous
inspection. SQ3000‑DD offers a compact dual‑sensor layout with a smart
conveyor design, reducing footprint compared with two standalone
systems.
Software ...
Nordson EFD
... Overview
FACTS² (AMI DF2400) is an
automated in-line C-SAM
inspection
system engineered for high-volume production. It delivers high throughput with minimal operator interaction by inspecting ...
Nordson EFD
... Overview
The QX Series 2D AOI
inspection
systems (QX600™ and QX250i™) provide calibration‑free, high‑throughput optical
inspection for SMT production lines. The platform integrates top and bottom ...
Nordson EFD
... electronics inspection requirements
Nordson EFD
... improved measurement accuracy
Nordson EFD
... Overview
The SQ3000M2 is an
automated optical
inspection (AOI)
system designed for wirebond, semiconductor packaging and PCB assembly applications. It provides inline defect detection and optional ...
Nordson EFD
... MXI Ruby XL is an X-ray inspection system designed for very large sample sizes and high-mass assemblies, suited to oversized PCB and large-format semiconductor panel inspection. The system ...
Nordson EFD
... from Nordson EFD uses the automated dispensing system's existing camera to inspect fluid deposit width and diameter to verify dispense requirements and placement accuracy. When paired with the optional OptiSure Confocal ...
Nordson EFD