Atomic force microscope Dimension Edge™
for researchbenchtop

atomic force microscope
atomic force microscope
atomic force microscope
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Characteristics

Type
atomic force
Applications
for research
Configuration
benchtop

Description

Best-in-class AFM capabilities to match all research budget levels Delivering best-in-class performance on any AFM sample Providing high measurement reproducibility for materials Incorporating ScanAsyst self-optimizing mode for easiest AFM imaging Powered by PeakForce Tapping Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop tip scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond. The Dimension Edge is equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results. Now the most advanced large-sample atomic force microscopy capabilities are available to every facility and user. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM.

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