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Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm
The FusionScope is a correlative AFM/SEM microscope that has been designed from the ground up to allow you to seamlessly take advantage of combining these two methods of analysis. For most analysis, it is often desirable ...
Magnification: 85 unit - 1,050 unit
Resolution: 1,300 nm
... Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale ...
HORIBA Scientific
Resolution: 638, 785, 532 nm
... combination. Move from microscopy to the nanoscopy world with an easy AFM upgrade FEATURES SWIFTTM10x faster Raman imaging Improved detection and sensitivity Full Confocality for complete image detail Full ...
HORIBA Scientific
Resolution: 1,300, 532, 638, 785 nm
Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer. Compact, fully automated and easy-to-use, the XploRA Nano ...
HORIBA Scientific
... imaging by aperture and scattering-type SNOM to experiments involving interactions of light with the sample such as absorption, excitation, nonlinear effects and quenching. Cutting Edge Optical near-field ...
Bruker Nano Surfaces
... workflow-based user interface DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms Vortis™ 2 controller for high-speed signal processing and lowest ...
Bruker Nano Surfaces
... maps. Label-free Measurements Tissue Biopsies Multiparametric, nanomechanical characterization of living samples in near-physiological conditions. Ideal for multi-layered cell structures and soft, highly topographic ...
Bruker Nano Surfaces
The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements ...
Bruker Nano Surfaces
Dimension Edge™ incorporates Bruker's PeakForce Tapping® technology to provide the highest levels of atomic force microscope (AFM) performance, functionality, and accessibility in its class. Based on the Dimension Icon ...
Bruker Nano Surfaces
... combination of superior resolution, performance, and unparalleled versatility and productivity. The MultiMode 8-HR atomic force microscope (AFM) further advances these capabilities to provide significant improvements ...
Bruker Nano Surfaces
The NanoWizard® 4 XP NanoScience atomic force microscope delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with ...
Bruker Nano Surfaces
Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique ...
Bruker Nano Surfaces
The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you ...
Bruker Nano Surfaces
The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does ...
Bruker Nano Surfaces
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe ...
Resolution: 0.1, 0.26 nm
AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. ...
Angstrom Advanced Inc.
Resolution: 0.13, 0.01 nm
AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM ...
Angstrom Advanced Inc.
Resolution: 0.01, 0.13 nm
OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform ...
Angstrom Advanced Inc.
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