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Scanning electron microscopes
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Magnification: 1,000,000 unit
... interface, TESCAN Essence™, which is at the heart of all TESCAN SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes or ...
TESCAN GmbH
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition ...
TESCAN GmbH
TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition ...
TESCAN GmbH
Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm
... fully functional atomic force microscope with SEM. It is capable of most normal measurement modes expected from a standard AFM, including contact, dynamic, and FIRE modes. Switch between a sub-nanometer resolution AFM ...
Resolution: 0.1 nm
Electron Microscopes called SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) ...
Magnification: 1 unit - 2,000,000 unit
... effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron ...
ZEISS Microscopy
Magnification: 3,000,000 unit
Resolution: 0.4 nm
... SU9000 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental ...
Hitachi High-Technologies
... Selected Area Electron Diffraction) modes as well as in scanning modes (STEM– Scanning Transmission Electron Microscope and SEM – Scanning ...
... With our electron microscope you are able to view on the submicron and nano scale. Our personal scanning electron microscope (SEM) helps you see beyond ...
Resolution: 1.8, 2.6, 2.5, 4.6, 1 µm
... the amount of lines, scanning speed and the dimension of the sample! White Light Confocal Measurement The NPS is an innovative non-contact confocal 3D profilometer measuring altitude in real time, for profile or surface ...
Hirox Europe
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