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Electronic microscopes
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Field Emission Scanning Electron Microscope Your ZEISS SIGMA FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy ZEISS Sigma 300 delivers excellence in price and performance. Achieve ...

Magnification: 5, 12, 7 unit
... environment control SPM measures within environments that cannot be realized by conventional large scale SPM units. The electronic measuring instrument under high vacuum conditions enables control to the lowest limits ...
Hitachi High-Technologies

... 25 is a unique investigative tool, which combines transmission TEM and STEM observation modes. Substantially lower accelerating voltages (ranging from 25 kV to 10 kV) than conventional TEM (typically ...

Magnification: 7 unit - 45 unit
The 77001S binocular universal continuous polyploidy microscope is equipped with a universal support, which can expand the operating range, and the object can be observed from any direction and Angle with high resolution, ...

... on the monitor screen. The microscope may operate in the following modes: low magnification; large increases in the ground or contrasting modes of operation; microdiffraction mainly or contrasting modes. The microscope ...

Angstrom AA6000 mini SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of ...

Angstrom AA8000-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. ...

Magnification: 40 unit - 1,600 unit
... biological microscope, excellent optical system design, classic shape, light and beautiful, easy to observe and use, long-term observation is not easy to fatigue. A variety of configurations are available, which can be ...

JSM-7900F Schottky Field Emission Scanning Electron Microscope JSM-7900F is JEOL’s new flagship FE-SEM which combines extreme high resolution imaging, enhanced stability and exceptional ease of use for any level of operator ...
Jeol

Resolution: 1, 1.8, 2.6, 2.5, 4.6 µm
when microscopy meets metrology The NPS is a white light confocal point sensor combined with an high precision motorized stage. It enables submicron altitude measurement on any type of surface without any contact on ...
Hirox Europe
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