Hitachi benchtop microscopes

As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform. With ...

... Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance -- sure to be the workhorse in any laboratory. The SU3500 Scanning ...

... of 110 mm. A 5-axis motorized stage makes the large chamber ideal for a wide variety of samples. The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic ...

TM3030Plus enables to enhance image quality in the low vacuum observation world. TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP SEM, and well-accepted by users as a high-sensitivity detector. It can ...

... system* The Hitachi-FIB-compatible specimen holder* requires no tweezer handling of TEM grids between FIB fabrication and TEM observation and ensures high-throughput TEM analysis. Hitachi's ...

The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from ...