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TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. ...
TESCAN GmbH
UHR SEM for nanomaterials characterization at sub-nanometer scale High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles ...
TESCAN GmbH
... capabilities for the structural analysis of biological samples. It seamlessly combines the high-precision milling capabilities of a Ga FIB with a BrightBeam™ UHR SEM for sub-surface exploration of a diverse ...
TESCAN GmbH
The TESCAN AMBER X is a high-performance focused plasma ion beam-scanning electron microscope (FIB-SEM) for extra-large volume analysis and high throughput cryo applications. Equipped ...
TESCAN GmbH
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