Hitachi microscopes

1 company | 12 products
{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
SEM microscope
SEM microscope
SU9000

Resolution: 0.4 nm
Magnification: 3,000,000 unit

Ultra-high Resolution Scanning Electron Microscope SU9000 The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ...

See the other products
Hitachi High-Technologies
optical microscope
optical microscope
Regulus series

As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform. With ...

See the other products
Hitachi High-Technologies
FA-STEM microscope
FA-STEM microscope
SU5000

Schottky Field Emission Scanning Electron Microscope SU5000 Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM ...

See the other products
Hitachi High-Technologies
SEM microscope
SEM microscope
SU3500

... Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance -- sure to be the workhorse in any laboratory. The SU3500 Scanning ...

See the other products
Hitachi High-Technologies
SEM microscope
SEM microscope
S-3700N

... of 110 mm. A 5-axis motorized stage makes the large chamber ideal for a wide variety of samples. The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic ...

See the other products
Hitachi High-Technologies
SEM microscope
SEM microscope
TM3030Plus

TM3030Plus enables to enhance image quality in the low vacuum observation world. TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP SEM, and well-accepted by users as a high-sensitivity detector. It can ...

See the other products
Hitachi High-Technologies
transmission electron microscope
transmission electron microscope
HF-3300

... system* The Hitachi-FIB-compatible specimen holder* requires no tweezer handling of TEM grids between FIB fabrication and TEM observation and ensures high-throughput TEM analysis. Hitachi's ...

See the other products
Hitachi High-Technologies
STEM microscope
STEM microscope
HD-2700

The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. ...

See the other products
Hitachi High-Technologies
FIB-SEM microscope
FIB-SEM microscope
NX9000

... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...

See the other products
Hitachi High-Technologies
FIB-SEM microscope
FIB-SEM microscope
NX2000

... the ultimate TEM sample preparation system FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing ...

See the other products
Hitachi High-Technologies