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Resolution: 0.4 nm
Magnification: 3,000,000 unit
Ultra-high Resolution Scanning Electron Microscope SU9000 The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ...
Hitachi High-Technologies
As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform. With ...
Hitachi High-Technologies
Schottky Field Emission Scanning Electron Microscope SU5000 Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM ...
Hitachi High-Technologies
... Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance -- sure to be the workhorse in any laboratory. The SU3500 Scanning ...
Hitachi High-Technologies
... of 110 mm. A 5-axis motorized stage makes the large chamber ideal for a wide variety of samples. The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic ...
Hitachi High-Technologies
TM3030Plus enables to enhance image quality in the low vacuum observation world. TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP SEM, and well-accepted by users as a high-sensitivity detector. It can ...
Hitachi High-Technologies
... system* The Hitachi-FIB-compatible specimen holder* requires no tweezer handling of TEM grids between FIB fabrication and TEM observation and ensures high-throughput TEM analysis. Hitachi's ...
Hitachi High-Technologies
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. ...
Hitachi High-Technologies
... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...
Hitachi High-Technologies
... the ultimate TEM sample preparation system FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing ...
Hitachi High-Technologies
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